Measure implant migration in vivo with standard CT:s

Implant migration at two years is predictive of the ten-year survival of an implant model. Such migration measurements used to require specialized and expensive RSA labs but can now, with a new technology called Sectra CT-based Micromotion Analysis (CTMA), be done using standard CT:s. In this webinar, researcher Olof Sandberg will give an overview of the underlying principles as well as some publications on Sectra CTMA®.

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